Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/25/2023
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Application #:
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17115236
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Filing Dt:
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12/08/2020
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Publication #:
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Pub Dt:
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08/05/2021
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Inventors:
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Abdellatif Zanati, Henrik Asendorf, Jan-Peter Schat, Nicolas Lamielle
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Title:
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TEST APPARATUS AND METHOD FOR TESTING A SEMICONDUCTOR DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 411 E. PLUMERIA DRIVE, M/S-41SJ |
| SAN JOSE, CALIFORNIA 95134 |
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| NXP B.V. |
| 411 E. PLUMERIA DRIVE |
| M/S-41SJ |
| SAN JOSE, CA 95134 |
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