Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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17084625
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Filing Dt:
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10/29/2020
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Publication #:
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Pub Dt:
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09/02/2021
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Inventors:
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Che-Yen LEE, Hua-Tai LIN, Chi-Yuan SUN, Ju-Ying CHEN, Chia-Fong CHANG, Te-Chih HUANG et al
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Title:
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METHOD FOR INSPECTING PATTERN DEFECTS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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NO.8, LI-HSIN RD. 6, SCIENCE BASED INDUSTRIAL PARK |
HSINCHU, TAIWAN 300 |
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MCDERMOTT WILL & EMERY LLP |
THE MCDERMOTT BUILDING |
500 NORTH CAPITOL STREET, N.W. |
WASHINGTON, DC 20001 |
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05/30/2024 03:03 PM
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