Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/03/2022
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Application #:
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17206654
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Filing Dt:
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03/19/2021
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Publication #:
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Pub Dt:
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09/23/2021
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Inventors:
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Hyungjin KIM, Chuljin PARK
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Title:
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Method of measuring critical dimension of a three-dimensional structure and apparatus for measuring the same
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2091, GYEONGCHUNG-DAERO, BUBAL-EUB |
| GYEONGGI-DO |
| ICHEON, KOREA, REPUBLIC OF 17336 |
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| 222, WANGSIMNI-RO, SEONGDONG-GU |
| SEOUL, KOREA, REPUBLIC OF 04763 |
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| AMPACC LAW GROUP, PLLC |
| 6100 219TH ST SW #580 |
| MOUNTLAKE TERRACE, WA 98043 |
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