Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/20/2024
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Application #:
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16610692
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Filing Dt:
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07/08/2021
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Publication #:
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Pub Dt:
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11/04/2021
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Inventors:
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Young-sik Ghim, Hyug-gyo Rhee
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Title:
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DEVICE AND METHOD FOR MEASURING THICKNESS AND REFRACTIVE INDEX OF MULTILAYER THIN FILM BY USING ANGLE-RESOLVED SPECTRAL REFLECTOMETRY
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Assignment:
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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267, GAJEONG-RO, YUSEONG-GU |
DAEJEON, KOREA, REPUBLIC OF 34113 |
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MARK D. PASSLER, AKERMAN LLP |
777 S. FLAGLER DRIVE |
SUITE 1100, WEST TOWER |
WEST PALM BEACH, FL 33401 |
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09/22/2024 02:33 PM
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