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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
11763181
Issue Dt:
09/19/2023
Application #:
17400157
Filing Dt:
08/12/2021
Publication #:
20220036218
Pub Dt:
02/03/2022
Inventors:
EITAN ROTHSTEIN, ILYA RUBINOVICH, NOAM TAL, BARAK BRINGOLTZ, YONGHA KIM, ARIEL BROITMAN et al
Title:
METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING
Assignment: 1
Reel/Frame:
057388/0077Recorded: 09/05/2021Pages: 15
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
ROTHSTEIN, EITAN
Exec Dt:
08/02/2021
RUBINOVICH, ILYA
Exec Dt:
02/05/2021
TAL, NOAM
Exec Dt:
12/27/2020
BRINGOLTZ, BARAK
Exec Dt:
04/30/2021
KIM, YONGHA
Exec Dt:
04/30/2021
BROITMAN, ARIEL
Exec Dt:
12/31/2020
COHEN, ODED
Exec Dt:
04/30/2021
RABINOVICH, EYLON
Exec Dt:
05/02/2021
ZAHARONI, TAL
Exec Dt:
02/04/2021
YOGEV, SHAY
Exec Dt:
12/22/2020
KANDEL, DANIEL
Exec Dt:
04/30/2021
Assignee:
NOVA LTD
5 DAVID FIKES ST.
REHOVOT, ISRAEL 7632805
Correspondent:
DANIEL J. SWIRSKY
11 REUVEN STREET
BEIT SHEMESH, 9954419 ISRAEL

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