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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
01/10/2023
Application #:
17414207
Filing Dt:
06/15/2021
Publication #:
Pub Dt:
03/03/2022
Inventors:
Jonathan Op de Beeck, Wilfried Vandervorst, Kristof Paredis, Claudia Fleischmann
Title:
Method and Apparatus for Aligning a Probe for Scanning Probe Microscopy to the Tip of a Pointed Sample
Assignment: 1
Reel/Frame:
057101/0429Recorded: 08/06/2021Pages: 6
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/17/2021
Exec Dt:
07/05/2021
Exec Dt:
08/06/2021
Assignee:
KAPELDREEF 75
LEUVEN, BELGIUM 3001
Correspondent:
MCDONNELL BOEHNEN HULBERT & BERGHOFF LLP
300 SOUTH WACKER DRIVE
3100
CHICAGO, IL 60606
Assignment: 2
Reel/Frame:
057101/0474Recorded: 08/06/2021Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
06/22/2021
Assignee:
WAAISTRAAT 6 - BOX 5105
LEUVEN, BELGIUM 3000
Correspondent:
MCDONNELL BOEHNEN HULBERT & BERGHOFF LLP
300 SOUTH WACKER DRIVE
SUITE 3100
CHICAGO, IL 60606

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