Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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17518327
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Filing Dt:
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11/03/2021
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Publication #:
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Pub Dt:
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05/05/2022
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Inventors:
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Yung-Eun Sung, Jungjin Park, Jae-Hyuk Park, Jong Sig Lee, Chunjoong Kim, Shin-Yeong Kim
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Title:
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IN-SITU X-RAY DIFFRACTION ANALYSIS APPARATUS INCLUDING PELTIER-TYPE TEMPERATURE CONTROL UNIT AND ANALYZING METHOD USING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1, GWANAK-RO, GWANAK-GU |
| SEOUL, KOREA, REPUBLIC OF 08826 |
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| 55, EXPO-RO, YUSEONGGU |
| DAEJEON, KOREA, REPUBLIC OF 34126 |
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| 99, DAEHAK-RO, YUSEONG-GU |
| DAEJEON, KOREA, REPUBLIC OF 34134 |
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| KILPATRICK TOWNSEND & STOCKTON LLP |
| 1100 PEACHTREE STREET |
| SUITE 2800 |
| ATLANTA, GA 30309 |
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