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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
17490347
Filing Dt:
09/30/2021
Publication #:
Pub Dt:
06/09/2022
Inventors:
Fei Yuan, Hong Wang, Jianmin Wu, Guoliang Shen, Tian Lan, Yue Tang, Haohan Wu, Yingli Zeng et al
Title:
DATA MANAGEMENT PLATFORM, INTELLIGENT DEFECT ANALYSIS SYSTEM, INTELLIGENT DEFECT ANALYSIS METHOD, COMPUTER-PROGRAM PRODUCT, AND METHOD FOR DEFECT ANALYSIS
Assignment: 1
Reel/Frame:
058817/0942Recorded: 01/29/2022Pages: 22
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
05/27/2021
Exec Dt:
05/27/2021
Exec Dt:
05/27/2021
Exec Dt:
05/27/2021
Exec Dt:
05/27/2021
Exec Dt:
05/27/2021
Exec Dt:
05/27/2021
Exec Dt:
05/27/2021
Exec Dt:
05/27/2021
Exec Dt:
05/27/2021
Assignee:
NO.10 JIUXIANQIAO RD.
CHAOYANG DISTRICT
BEIJING, CHINA 100015
Correspondent:
SHENGFENG CHEN
111 N MARKET ST, SUITE 300
SAN JOSE, CA 95113

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