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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
NONE
Issue Dt:
Application #:
17688856
Filing Dt:
03/07/2022
Publication #:
20220199437
Pub Dt:
06/23/2022
Inventors:
Renan Milo, Moran Zaberchik, David Izraeli, Roie Volkovich, Liran Yerushalmi, Yoel Feler
Title:
METHOD FOR MEASURING AND CORRECTING MISREGISTRATION BETWEEN LAYERS IN A SEMICONDUCTOR DEVICE, AND MISREGISTRATION TARGETS USEFUL THEREIN
Assignment: 1
Reel/Frame:
059253/0192Recorded: 03/14/2022Pages: 8
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
VOLKOVICH, ROIE
Exec Dt:
05/19/2019
MILO, RENAN
Exec Dt:
06/19/2019
YERUSHALMI, LIRAN
Exec Dt:
05/16/2019
Assignee:
KLA-TENCOR CORPORATION
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
HODGSON RUSS LLP
140 PEARL STREET
SUITE 100
BUFFALO, NY 14202-4040
Assignment: 2
Reel/Frame:
059253/0265Recorded: 03/14/2022Pages: 8
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
ZABERCHIK, MORAN
Exec Dt:
06/23/2019
FELER, YOEL
Exec Dt:
05/19/2019
IZRAELI, DAVID
Exec Dt:
06/13/2019
Assignee:
KLA-TENCOR CORPORATION
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
HODGSON RUSS LLP
140 PEARL STREET
SUITE 100
BUFFALO, NY 14202

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