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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
17836747
Filing Dt:
06/09/2022
Publication #:
Pub Dt:
09/29/2022
Inventors:
Fei SUN, Wanduo WU, Zhaomin WANG, Dejin ZHENG, Jiaqi WANG, Rui SUN
Title:
TOF DEPTH MEASURING DEVICE AND METHOD
Assignment: 1
Reel/Frame:
060154/0055Recorded: 06/09/2022Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
05/23/2022
Exec Dt:
05/23/2022
Exec Dt:
05/23/2022
Exec Dt:
05/23/2022
Exec Dt:
05/23/2022
Exec Dt:
05/23/2022
Assignee:
12/F, HI-TECH ZONE UNION TOWER
NO. 63 XUEFU ROAD, NANSHAN DISTRICT
SHENZHEN, GUANGDONG, CHINA 518057
Correspondent:
SHEPPARD MULLIN RICHTER & HAMPTON LLP
1540 EL CAMINO REAL, SUITE 120
ATTN: WILL CHEN
MENLO PARK, CA 94025-4111

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