Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/27/2023
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Application #:
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17331675
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Filing Dt:
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05/27/2021
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Publication #:
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Pub Dt:
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12/01/2022
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Inventors:
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Yen-Chun LIN, Chung-Yi LIN, Yen-Sen WANG, Bao-Ru YOUNG
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Title:
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TEST LINE STRUCTURE, SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING TEST LINE STRUCTURE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO. 8, LI-HSIN RD. 6, HSINCHU SCIENCE PARK |
| HSINCHU, TAIWAN 300-78 |
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| MCCLURE, QUALEY & RODACK, LLP |
| 280 INTERSTATE NORTH CIRCLE SE |
| SUITE 550 |
| ATLANTA, GA 30339 |
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