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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
NONE
Issue Dt:
Application #:
17402832
Filing Dt:
08/16/2021
Publication #:
Pub Dt:
02/16/2023
Inventors:
Dermot P. Cantwell, Changgong Wang, Nasreen Chopra, Moon Kyu Oh
Title:
USING DEFECT MODELS TO ESTIMATE DEFECT RISK AND OPTIMIZE PROCESS RECIPES
Assignment: 1
Reel/Frame:
057190/0793Recorded: 08/16/2021Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
07/12/2021
Exec Dt:
07/12/2021
Exec Dt:
07/12/2021
Assignee:
3050 BOWERS AVENUE
SANTA CLARA, CALIFORNIA 95054
Correspondent:
PATENT DOCKET ADMINISTRATOR
ONE LOWENSTEIN DRIVE
LOWENSTEIN SANDLER LLP
ROSELAND, NJ 07068
Assignment: 2
Reel/Frame:
057199/0191Recorded: 08/17/2021Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
08/16/2021
Assignee:
3050 BOWERS AVENUE
SANTA CLARA, CALIFORNIA 95054
Correspondent:
PATENT DOCKET ADMINISTRATOR
ONE LOWENSTEIN DRIVE
LOWENSTEIN SANDLER LLP
ROSELAND, NJ 07068

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