Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
Total Assignments:
1
|
Patent #:
|
|
Issue Dt:
|
03/14/2023
|
Application #:
|
17873727
|
Filing Dt:
|
07/26/2022
|
Publication #:
|
|
Pub Dt:
|
02/23/2023
| | | | |
Inventors:
|
Sung Hoon HONG, Hyun Jin CHANG, Hyun Chul LEE, Jack WOO
|
Title:
|
OVERLAY MARK, OVERLAY MEASUREMENT METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD USING THE OVERLAY MARK
|
|
Assignment:
1
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
#15-23, DONGTANSANDAN 6-GIL, DONGTAN-MYEON |
HWASEONG-SI, GYEONGGI-DO, KOREA, REPUBLIC OF 18487 |
|
|
|
NOVICK, KIM & LEE, PLLC |
3251 OLD LEE HIGHWAY, SUITE 500 |
FAIRFAX, VA 22030 |
|
|
Search Results as of:
06/23/2024 03:31 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|