Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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17677681
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Filing Dt:
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02/22/2022
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Publication #:
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Pub Dt:
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03/09/2023
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Inventor:
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Tomoki TAKAYOSHI
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Title:
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INSPECTION METHOD, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, INSPECTION APPARATUS, INSPECTION SYSTEM, AND STORAGE MEDIUM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, SHIBAURA 1-CHOME |
| MINATO-KU, TOKYO, JAPAN |
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| 1-1, SHIBAURA 1-CHOME |
| MINATO-KU, TOKYO, JAPAN |
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| ALLEN & OVERY LLP |
| 1101 NEW YORK AVE NW |
| DAVID M. TENNANT |
| WASHINGTON, DC 20005 |
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