Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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18072471
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Filing Dt:
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11/30/2022
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Publication #:
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Pub Dt:
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06/08/2023
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Inventors:
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Futoshi YURUGI, Keisuke YOSHIDA
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Title:
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X-RAY INSPECTION APPARATUS, X-RAY INSPECTION SYSTEM, AND X-RAY INSPECTION METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 44 SANNO-CHO, SHOGOIN |
| SAKYO-KU, KYOTO-SHI, JAPAN 606-8392 |
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| GLOBAL IP COUNSELORS, LLP |
| 1233 20TH ST. NW |
| SUITE 600 |
| WASHINGTON, DC 20036 |
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