Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
1
|
|
Patent #:
|
NONE
|
Issue Dt:
|
|
Application #:
|
17732212
|
Filing Dt:
|
04/28/2022
|
|
Publication #:
|
|
Pub Dt:
|
07/27/2023
| | | | |
|
Inventors:
|
David W. Price, Robert J. Rathert, Chet V. Lenox, Oreste Donzella, Justin Lach et al
|
|
Title:
|
SYSTEM FOR AUTOMATIC DIAGNOSTICS AND MONITORING OF SEMICONDUCTOR DEFECT DIE SCREENING PERFORMANCE THROUGH OVERLAY OF DEFECT AND ELECTRICAL TEST DATA
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
|
|
|
|
| MATTHEW POULSEN, PHD. |
| SUITER SWANTZ INTELLECTUAL PROPERTY |
| 14301 FNB PARKWAY, SUITE 220 |
| OMAHA, NE 68154 |
|
|
Search Results as of:
09/22/2024 12:44 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
