Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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18146304
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Filing Dt:
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12/23/2022
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Publication #:
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Pub Dt:
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07/27/2023
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Inventors:
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Shigetoshi YAMAGISHI, Masahiko ISHIDA, Naruhiro HOSHINO, Atsushi YOSHIDA
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Title:
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QUALITY EVALUATION METHOD, MANUFACTURING SYSTEM OF SILICON FOR EVALUATION, MANUFACTURING METHOD OF SILICON FOR EVALUATION, AND SILICON FOR EVALUATION
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 4-1, MARUNOUCHI 1-CHOME |
| CHIYODA-KU |
| TOKYO, JAPAN 100-0005 |
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| LADAS & PARRY LLP |
| 4525 WILSHIRE BOULEVARD, SUITE 240 |
| LOS ANGELES, CA 90010 |
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