Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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18152252
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Filing Dt:
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01/10/2023
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Publication #:
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Pub Dt:
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07/27/2023
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Inventors:
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Yuki DOI, Hideki NAKAYAMA, Naoaki KONDO, Atsushi MIYAMOTO, Hirohiko KITSUKI
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Title:
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DEFECT OBSERVATION METHOD, APPARATUS, AND PROGRAM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 17-1, TORANOMON 1-CHOME |
| MINATO-KU, TOKYO, JAPAN 105-6409 |
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| FOLEY & LARDNER LLP |
| 3000 K STREET N.W. |
| SUITE 600 |
| WASHINGTON, D.C., 20007-5109 UNITED STATES |
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