Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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18026814
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Filing Dt:
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03/16/2023
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Publication #:
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Pub Dt:
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10/12/2023
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Inventors:
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Ahjin JO, Seung Hun BAIK, Seonghun YUN, Byoung-Woon AHN, Sang-il PARK
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Title:
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METHOD FOR MEASURING, BY MEASUREMENT DEVICE, CHARACTERISTICS OF SURFACE OF OBJECT TO BE MEASURED, ATOMIC FORCE MICROSCOPE FOR PERFORMING SAME METHOD, AND COMPUTER PROGRAM STORED IN STORAGE MEDIUM TO PERFORM SAME METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| KANC 4TH FLOOR, 109, GWANGGYO-RO, YEONGTONG-GU |
| SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF 16229 |
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| INVENSTONE PATENT, LLC. |
| 7925 JONES BRANCH DR SUITE 3100-A |
| MCLEAN, VA 22102 |
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