Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
1
|
|
Patent #:
|
NONE
|
Issue Dt:
|
|
Application #:
|
18181171
|
Filing Dt:
|
03/09/2023
|
|
Publication #:
|
|
Pub Dt:
|
11/16/2023
| | | | |
|
Inventors:
|
Yoshinari IKEDA, Motohito HORI, Takaaki TANAKA, Qichen WANG
|
|
Title:
|
SEMICONDUCTOR DEVICE AND METHOD FOR DETERMINING DETERIORATION OF SEMICONDUCTOR DEVICE
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| 1-1, TANABESHINDEN, KAWASAKI-KU |
| KAWASAKI-SHI, KANAGAWA, JAPAN 210-9530 |
|
|
|
|
| RABIN & BERDO, P.C. |
| 2650 PARK TOWER DRIVE, SUITE 800 |
| VIENNA, VA 22180 |
|
|
Search Results as of:
05/10/2024 12:22 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
