Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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NONE
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Issue Dt:
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Application #:
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18334078
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Filing Dt:
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06/13/2023
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Publication #:
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Pub Dt:
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01/04/2024
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Inventor:
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Wan Soon PARK
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Title:
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SEMICONDUCTOR TEST APPARATUS USING FPGA AND MEMORY CONTROL METHOD FOR SEMICONDUCTOR TEST
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 29 PANGYO-RO 255BEON-GIL, BUNDANG-GU |
| SEONGNAM-SI, GYEONGGI-DO, KOREA, REPUBLIC OF 13486 |
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| HARNESS, DICKEY & PIERCE, P.L.C. |
| P.O. BOX 8910 |
| RESTON, VA 20195 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| 28, PANGYO-RO 255BEON-GIL, BUNDANG-GU, SEONGNAM-SI, |
| (SAMPYEONG-DONG, DHK SOLUTION BUILDING) |
| GYEONGGI-DO,, KOREA, REPUBLIC OF |
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| SUNG PIL KIM |
| 12950 WORLDGATE DR., SUITE 750 |
| HERNDON, VA 20170 |
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09/22/2024 02:03 AM
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