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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
18222608
Filing Dt:
07/17/2023
Publication #:
Pub Dt:
03/07/2024
Inventors:
Hyunwoo RYOO, Minji Jeon, Hidong Kwak, Jeongho Ahn, Seulji Song
Title:
APPARATUS AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE
Assignment: 1
Reel/Frame:
064281/0948Recorded: 07/17/2023Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/14/2023
Exec Dt:
06/20/2023
Exec Dt:
06/14/2023
Exec Dt:
06/14/2023
Exec Dt:
06/19/2023
Assignee:
129, SAMSUNG-RO, YEONGTONG-GU, GYEONGGI-DO,
SUWON-SI, KOREA, REPUBLIC OF 16677
Correspondent:
SUGHRUE MION, PLLC
2000 PENNSYLVANIA AVENUE, N.W.
SUITE 9000
WASHINGTON, DC 20006

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