Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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17901705
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Filing Dt:
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09/01/2022
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Publication #:
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Pub Dt:
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03/14/2024
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Inventors:
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Michal Eilon, Doron Girmonsky, Dror Shemesh, Uri Hadar
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Title:
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Z-PROFILING OF WAFERS BASED ON X-RAY MEASUREMENTS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 9 OPPENHEIMER STREET |
| REHOVOT, ISRAEL 7670109 |
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| KILPATRICK TOWNSEND & STOCKTON LLP |
| 1100 PEACHTREE STREET, SUITE 2800 |
| ATLANTA, GA 30309 |
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