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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
NONE
Issue Dt:
Application #:
18388623
Filing Dt:
11/10/2023
Publication #:
Pub Dt:
05/16/2024
Inventor:
Nagasubramaniyan Chandrasekaran
Title:
DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING
Assignment: 1
Reel/Frame:
066838/0570Recorded: 03/20/2024Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
12/04/2023
Assignee:
8000 SOUTH FEDERAL WAY
BOISE, IDAHO 83716-9632
Correspondent:
PATENT DOCKET ADMINISTRATOR
LOWENSTEIN SANDLER LLP
ONE LOWENSTEIN DRIVE
ROSELAND, NJ 07068
Assignment: 2
Reel/Frame:
066884/0927Recorded: 03/25/2024Pages: 5
Conveyance:
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE PREVIOUSLY RECORDED AT REEL: 066838 FRAME: 0570. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT.
Assignor:
Exec Dt:
12/04/2023
Assignee:
8000 SOUTH FEDERAL WAY
BOISE, IDAHO 83716-9632
Correspondent:
PATENT DOCKET ADMINISTRATOR
LOWENSTEIN SANDLER LLP
ONE LOWENSTEIN DRIVE
ROSELAND, NJ 07068

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