Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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NONE
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Issue Dt:
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Application #:
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18388623
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Filing Dt:
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11/10/2023
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Publication #:
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Pub Dt:
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05/16/2024
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Inventor:
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Nagasubramaniyan Chandrasekaran
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Title:
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DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 8000 SOUTH FEDERAL WAY |
| BOISE, IDAHO 83716-9632 |
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| PATENT DOCKET ADMINISTRATOR |
| LOWENSTEIN SANDLER LLP |
| ONE LOWENSTEIN DRIVE |
| ROSELAND, NJ 07068 |
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Assignment:
2
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CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE PREVIOUSLY RECORDED AT REEL: 066838 FRAME: 0570. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT.
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| 8000 SOUTH FEDERAL WAY |
| BOISE, IDAHO 83716-9632 |
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| PATENT DOCKET ADMINISTRATOR |
| LOWENSTEIN SANDLER LLP |
| ONE LOWENSTEIN DRIVE |
| ROSELAND, NJ 07068 |
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06/27/2024 02:58 AM
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