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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
18595482
Filing Dt:
03/05/2024
Publication #:
Pub Dt:
09/19/2024
Inventors:
Keisuke YOSHIDA, Futoshi YURUGI, Osamu HIROSE, Kazuyuki SUGIMOTO
Title:
X-RAY INSPECTION APPARATUS AND SENSITIVITY CORRECTION METHOD FOR X-RAY INSPECTION APPARATUS
Assignment: 1
Reel/Frame:
066642/0153Recorded: 03/05/2024Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/21/2024
Exec Dt:
02/22/2024
Exec Dt:
02/22/2024
Exec Dt:
02/22/2024
Assignee:
44 SANNO-CHO, SHOGOIN, SAKYO-KU
KYOTO-SHI, KYOTO, JAPAN 606-8392
Correspondent:
GLOBAL IP COUNSELORS LLP
1233 20TH ST. NW
SUITE 600
WASHINGTON, DC 20036

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