Patent Assignment Details
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Reel/Frame: | 004650/0062 | |
| Pages: | 1 |
| | Recorded: | 11/26/1986 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST. |
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Total properties:
1
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Patent #:
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Issue Dt:
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11/29/1988
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Application #:
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06935381
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Filing Dt:
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11/26/1986
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Title:
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METHOD AND APPARATUS FOR MEASURING THE THICKNESS OF A THIN FILM USING THE SPECTRAL REFLECTION FACTOR OF THE FILM
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Assignee
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3-30-2 SHIMOMARUKO, OHTA-KU, |
A CORP OF JAPAN |
TOKYO, JAPAN |
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Correspondence name and address
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FITZPATRICK, CELLA, HARPER & SCINTO
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277 PARK AVE.
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NEW YORK, NY 10172
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