Patent Assignment Details
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Reel/Frame: | 005083/0982 | |
| Pages: | 1 |
| | Recorded: | 05/18/1989 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST. |
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Total properties:
1
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Patent #:
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Issue Dt:
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01/15/1991
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Application #:
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07353764
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Filing Dt:
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05/18/1989
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Title:
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METHOD AND SYSTEM FOR INSPECTING PLURAL SEMICONDUCTOR DEVICES
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Assignee
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7-1, SHIMORENJAKU 9-CHOME, MITAKA-SHI |
TOKYO, JAPAN |
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Correspondence name and address
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DAVID S. SAFRAN
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SIXBEY, FRIEDMAN, LEEDOM & FERGUSON
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7653 LEESBURG PIKE
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FALLS CHURCH, VA 22043
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