Patent Assignment Details
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| Reel/Frame: | 006554/0926 | |
| Pages: | 2 |
| | Recorded: | 05/27/1993 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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01/31/1995
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Application #:
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08038694
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Filing Dt:
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03/29/1993
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Title:
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METHOD AND APPARATUS FOR DETERMINATION OF INTERSTITIAL OXYGEN CONCENTRATION IN SILICON SINGLE CRYSTAL
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Assignee
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| 4-2, MARUNOUCHI 1 CHOME, CHIYODA-KU |
| TOKYO, JAPAN |
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Correspondence name and address
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TOWNSEND, SNIDER & BANTA
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RONALD R. SNIDER
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1401 NEW YORK AVENUE, N.W.
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SUITE 1250
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WASHINGTON, D.C. 20005
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