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Patent Assignment Details
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Reel/Frame:006880/0299   Pages: 2
Recorded: 02/14/1994
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
01/02/1996
Application #:
08195196
Filing Dt:
02/14/1994
Title:
A SCANNING PROBE MICROSCOPE FOR OBSERVING A SAMPLE SURFACE WHILE APPLYING AN AC BIAS VOLTAGE BETWEEN THE SAMPLE AND A PROBE
Assignors
1
Exec Dt:
02/04/1994
2
Exec Dt:
02/04/1994
3
Exec Dt:
02/04/1994
4
Exec Dt:
02/04/1994
Assignee
1
30-2, 3-CHOME, SHIMOMARUKO
OHTA-KU, TOKYO, JAPAN
Correspondence name and address
JACK S. CUBERT
FITZPATRICK, CELLA, HARPER ET AL
277 PARK AVENUE
NEW YORK, NY 10172-0194

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