Patent Assignment Details
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Reel/Frame: | 007955/0024 | |
| Pages: | 3 |
| | Recorded: | 04/25/1996 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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08/19/1997
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Application #:
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08599890
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Filing Dt:
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02/12/1996
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Title:
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METHOD FOR MEASURING PARASITIC COMPONENTS OF A FIELD EFFECT TRANSISTOR AND A SEMICONDUCTOR INTEGRATED CIRCUIT
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Assignee
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1-1, MINAMI-AOYAMA 2-CHOME, MINATO-KU |
TOKYO, JAPAN |
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Correspondence name and address
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CONRAD R. SOLUM, JR., ESQ.
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LYON & LYON LLP
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FIRST INTERSTATE WORLD CENTER
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633 WEST FIFTH STREET, SUITE 4700
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LOS ANGELES, CA 90071-2066
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