Patent Assignment Details
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Reel/Frame: | 009125/0088 | |
| Pages: | 3 |
| | Recorded: | 04/16/1998 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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11/28/2000
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Application #:
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08921829
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Filing Dt:
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09/02/1997
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Title:
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METHOD OF MEASURING FREE CARRIER CONCENTRATION AND/OR THICKNESS OF A SEMICONDUCTOR AND PROCESS OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR WAFER USING SUCH METHOD
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Assignee
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26-10, TENJIN 2-CHOME |
A JAPANESE CORPORATION |
NAGAOKAKYO-SHI, KYOTO-FU, JAPAN |
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Correspondence name and address
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OSTROLENK, FABER, GERB & SOFFEN, LLP
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MARTIN PFEFFER
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1180 AVENUE OF THE AMERICAS
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NEW YORK, NY 10036-8403
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