Patent Assignment Details
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For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 010278/0058 | |
| Pages: | 2 |
| | Recorded: | 01/14/1999 | | |
| Conveyance: | RE-RECORD TO CORRECT SERIAL NUMBER THAT WAS ERRONEOUSLY ASSIGNED BY THE PATENT AND TRADEMARK OFFICE. DOCUMENT PREVIOUSLY RECORDED ON 1-14-1999 AT REEL 9715, FRAME 0833. ASSIGNOR HEREBY CONFIRMS THE ASSIGNMENT OF THE ENTIRE INTEREST. |
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Total properties:
1
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Patent #:
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Issue Dt:
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04/03/2001
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Application #:
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09229749
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Filing Dt:
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01/14/1999
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Title:
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METHOD FOR TESTING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE WITH TRANSISTOR CIRCUIT FOR MARKING
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Assignee
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| 7-1, SHIBA 5-CHOME, MINATO-KU |
| TOKYO, JAPAN |
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Correspondence name and address
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FOLEY & LARDNER
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DAVID A. BLUMENTHAL
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3000 K STREET, N.W., SUITE 500
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WASHINGTON, DC 20007-5109
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