Patent Assignment Details
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| Reel/Frame: | 011093/0678 | |
| Pages: | 3 |
| | Recorded: | 09/18/2000 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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05/07/2002
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Application #:
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09597577
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Filing Dt:
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06/20/2000
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Title:
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METHOD OF EVALUATING QUALITY OF SILICON WAFER AND METHOD OF RECLAIMING THE WAFER
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Assignees
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| 3-18, WAKINOHAMA-CHO 1-CHOME |
| CHUO-KU, KOBE-SHI, HYOGO, JAPAN 651-0 |
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| 31031 HUNTWOOD AV. |
| HAYWARD, CALIFORNIA 94544 |
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Correspondence name and address
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OBLON SPIVAK MCCLELLAND, ET AL.
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NORMAN F. OLBLON
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FOURTH FLOOR
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1755 JEFFERSON DAVIS HIGHWAY
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ARLINGTON, VA 22202
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