Patent Assignment Details
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Reel/Frame: | 011512/0944 | |
| Pages: | 2 |
| | Recorded: | 02/06/2001 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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07/15/2003
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Application #:
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09663700
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Filing Dt:
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09/15/2000
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Title:
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TESTING APPARATUS AND TESTING METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT
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Assignee
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NISHI-SHINJUKU 2-CHOME |
NS BUILDING, 4-1 |
SHINJUKU-KU, TOKYO, JAPAN |
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Correspondence name and address
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MURAMATSU & ASSOCIATES
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YASUO MUARMATSU
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7700 IRVINE CENTER DRIVE, SUITE 225
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SECOND FLOOR
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IRVINE, CA 92618
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