Patent Assignment Details
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| Reel/Frame: | 011649/0399 | |
| Pages: | 4 |
| | Recorded: | 04/03/2001 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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09/30/2003
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Application #:
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09748279
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Filing Dt:
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12/27/2000
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Publication #:
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Pub Dt:
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08/23/2001
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Title:
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PROBE CARD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD OF MANUFACTURING THE SAME
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Assignee
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| 2-3, MARUNOUCHI 2-CHOME |
| CHIYODA-KU, TOKYO 100-8310, JAPAN |
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Correspondence name and address
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BURNS, DOANE, SWECKER & MATHIS, L.L.P.
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PLATON N. MANDROS
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P.O. BOX 1404
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ALEXANDRIA, VIRGINIA 22313-1404
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