Patent Assignment Details
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Reel/Frame: | 011962/0259 | |
| Pages: | 5 |
| | Recorded: | 07/09/2001 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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09756309
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Filing Dt:
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01/08/2001
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Publication #:
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Pub Dt:
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11/08/2001
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Title:
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Polysilicon evaluating method, polysilicon inspection apparatus and method for preparation of thin film transistor
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Assignee
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7-35, KITASHINAGAWA 6-CHOME, SHINAGAWA-KU |
TOKYO 141, JAPAN |
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Correspondence name and address
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SONNENSCHEIN NATH & ROSENTHAL
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DAVID R. METZGER
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WACKER DRIVE STATION
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P.O. BOX #061080 SEARS TOWER
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CHICAGO, IL 60606-1080
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