Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
| Reel/Frame: | 012157/0232 | |
| Pages: | 2 |
| | Recorded: | 09/12/2001 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
|
|
Total properties:
1
|
|
|
|
Patent #:
|
NONE
|
Issue Dt:
|
|
Application #:
|
09905937
|
Filing Dt:
|
07/17/2001
|
|
Publication #:
|
|
Pub Dt:
|
03/14/2002
| | | | |
|
Title:
|
Method and device for measuring thickness of test object
|
|
|
Assignee
|
|
|
|
|
| SHINJUKU-KU |
| 10-15, TAKADANOBABA 1-CHOME |
| TOKYO 169-0075, JAPAN |
|
|
Correspondence name and address
|
| |
OLIFF & BERRIDGE, PLC
|
| |
JAMES A. OLIFF
|
| |
PO BOX 19928
|
| |
ALEXANDRIA, VA 22320
|
Search Results as of:
05/03/2024 03:33 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
