Patent Assignment Details
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| Reel/Frame: | 013259/0828 | |
| Pages: | 2 |
| | Recorded: | 08/29/2002 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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08/30/2005
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Application #:
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10230416
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Filing Dt:
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08/29/2002
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Publication #:
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Pub Dt:
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01/02/2003
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Title:
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METHOD AND ITS APPARATUS FOR INSPECTING PARTICLES OR DEFECTS OF A SEMICONDUCTOR DEVICE
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Assignees
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| 6, KANDA SURUGADAI 4-CHOME |
| CHIYODA-KU |
| TOKYO, JAPAN |
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| F NISSEI EBISU BLDG., 16-3, HIGASHI 3-CHOME |
| SHIBUYA-KU |
| TOKYO, JAPAN |
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Correspondence name and address
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ANTONELLI, TERRY, STOUT ET AL.
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MELVIN KRAUS
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1300 NORTH SEVENTEENTH STREET
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SUITE 1800
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ARLINGTON, VA 22209
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