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Patent Assignment Details
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Reel/Frame:014020/0807   Pages: 4
Recorded: 10/01/2003
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
08/08/2006
Application #:
10468899
Filing Dt:
10/01/2003
Publication #:
Pub Dt:
04/08/2004
Title:
FILM THICKNESS MEASURING MONITOR WAFER
Assignors
1
Exec Dt:
08/29/2003
2
Exec Dt:
08/28/2003
3
Exec Dt:
08/28/2003
Assignees
1
6-4, TSUKIJI 5-CHOME, CHUO-KU
TOKYO, JAPAN 104-8439
2
3-16-2, TAMAHARA, TAMANO-SHI
OKAYAMA, JAPAN 706-0014
Correspondence name and address
OLIFF & BERRIDGE, PLC
JAMES A. OLIFF
P.O. BOX 19928
ALEXANDRIA, VA 22320

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