Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Reel/Frame: | 015045/0030 | |
| Pages: | 4 |
| | Recorded: | 03/05/2004 | | |
Conveyance: | CORRECTIVE ASSIGNMENT TO CORRECT THE THIRD ASSIGNORS NAME. DOCUMENT PREVIOUSLY RECORDED AT REEL 014338 FRAME 0343. |
|
Total properties:
1
|
|
Patent #:
|
NONE
|
Issue Dt:
|
|
Application #:
|
09955080
|
Filing Dt:
|
09/19/2001
|
Publication #:
|
|
Pub Dt:
|
11/14/2002
| | | | |
Title:
|
Semiconductor device evaluation method and apparatus, semiconductor device manufacturing control method, semiconductor device manufacturing method, and recording medium
|
|
Assignee
|
|
|
2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU |
TOKYO 100-8310, JAPAN |
|
Correspondence name and address
|
|
OBLON, SPIVAK, MCCLELLAND, MAIER & NEUST
|
|
1940 DUKE STREET
|
|
ALEXANDRIA, VA 22314
|
Search Results as of:
05/13/2024 05:08 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|