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Reel/Frame:016047/0207   Pages: 7
Recorded: 12/06/2004
Attorney Dkt #:223467us6pct/hye
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
05/10/2005
Application #:
10168544
Filing Dt:
07/02/2002
Publication #:
Pub Dt:
12/19/2002
Title:
METHOD OF WAFER BAND-EDGE MEASUREMENT USING TRANSMISSION SPECTROSCOPY AND A PROCESS FOR CONTROLLING THE TEMPERATURE UNIFORMITY OF A WAFER
Assignors
1
Exec Dt:
06/06/2002
2
Exec Dt:
06/03/2002
3
Exec Dt:
06/03/2002
Assignee
1
TBS BROADCAST CENTER
3-6, AKASAKA 5-CHOME, MINATO-KU
TOKYO 107, JAPAN
Correspondence name and address
OBLON, SPIVAK, MCCLELLAND, MAIER & NEUST
1940 DUKE STREET
ALEXANDRIA, VA 22314

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