Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 016547/0118 | |
| Pages: | 3 |
| | Recorded: | 07/21/2005 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
11
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Patent #:
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Issue Dt:
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12/14/1999
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Application #:
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08831298
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Filing Dt:
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04/01/1997
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Title:
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SYSTEM QUALITY CONTROL WHERE INSPECTION FREQUENCY OF INSPECTION APPARATUS IS RESET TO MINIMIZE EXPECTED TOTAL LOSS BASED ON DERIVED FREQUENCY FUNCTION AND LOSS VALUE
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Patent #:
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Issue Dt:
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06/25/2002
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Application #:
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09362135
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Filing Dt:
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07/28/1999
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Title:
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APPARATUS AND METHOD FOR TESTING DEFECTS
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Patent #:
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Issue Dt:
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04/02/2002
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Application #:
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09604251
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Filing Dt:
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06/27/2000
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Title:
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Method of manufacturing semiconductor device
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Patent #:
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Issue Dt:
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07/22/2003
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Application #:
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09644069
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Filing Dt:
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08/23/2000
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Title:
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APPARATUS METHOD OF INSPECTING FOREIGN PARTICLE OR DEFECT ON A SAMPLE
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Patent #:
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Issue Dt:
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05/03/2005
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Application #:
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09791682
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Filing Dt:
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02/26/2001
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Publication #:
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Pub Dt:
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12/06/2001
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Title:
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METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF
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Patent #:
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Issue Dt:
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05/17/2005
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Application #:
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09791742
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Filing Dt:
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02/26/2001
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Publication #:
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Pub Dt:
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10/18/2001
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Title:
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SURFACE INSPECTION APPARATUS AND METHOD THEREOF
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Patent #:
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Issue Dt:
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05/04/2004
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Application #:
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09973000
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Filing Dt:
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10/10/2001
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Publication #:
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Pub Dt:
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04/11/2002
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Title:
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APPARATUS FOR DETECTING FOREIGN PARTICLE AND DEFECT AND THE SAME METHOD
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Patent #:
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Issue Dt:
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03/06/2007
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Application #:
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10050776
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Filing Dt:
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01/18/2002
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Publication #:
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Pub Dt:
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09/05/2002
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Title:
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.APPARATUS AND METHOD FOR INSPECTING DEFECTS
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Patent #:
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Issue Dt:
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04/05/2005
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Application #:
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10119018
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Filing Dt:
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04/10/2002
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Publication #:
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Pub Dt:
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12/05/2002
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Title:
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METHOD FOR ANALYZING DEFECT DATA AND INSPECTION APPARATUS AND REVIEW SYSTEM
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Patent #:
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Issue Dt:
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08/30/2005
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Application #:
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10230416
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Filing Dt:
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08/29/2002
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Publication #:
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Pub Dt:
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01/02/2003
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Title:
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METHOD AND ITS APPARATUS FOR INSPECTING PARTICLES OR DEFECTS OF A SEMICONDUCTOR DEVICE
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Patent #:
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Issue Dt:
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05/24/2005
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Application #:
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10235656
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Filing Dt:
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09/06/2002
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Publication #:
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Pub Dt:
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08/28/2003
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Title:
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APPARATUS AND METHOD FOR MEASURING ALIGNMENT ACCURACY, AS WELL AS METHOD AND SYSTEM FOR MANUFACTURING SEMICONDUCTOR DEVICE
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Assignee
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| 24-14, NISHISHINBASHI 1-CHOME, MINATO-KU |
| TOKYO, JAPAN |
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Correspondence name and address
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MELVIN KRAUS
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ANTONELLI, TERRY, STOUT & KRAUS
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1300 N. 17TH STREET, SUITE 1800
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ARLINGTON, VA 22209
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