Patent Assignment Details
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| Reel/Frame: | 016734/0717 | |
| Pages: | 2 |
| | Recorded: | 06/29/2005 | | |
| Attorney Dkt #: | 260409US3XCIP |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10964647
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Filing Dt:
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10/15/2004
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Publication #:
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Pub Dt:
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11/24/2005
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Title:
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Method and apparatus for measuring temperature of substrate
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Assignees
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| 2-096, 5-17, RINKU-PORT KITA, TAJIRI-CHO |
| SENNAN-GUN, OSAKA 598-0093, JAPAN |
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| 3-6, AKASAKA 5-CHOME, MINATO-KU |
| TOKYO 107-8481, JAPAN |
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Correspondence name and address
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OBLON, SPIVAK, MCCLELLAND, MAIER & NEUST
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1940 DUKE STREET
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ALEXANDRIA, VA 22314
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