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Reel/Frame:017324/0575   Pages: 3
Recorded: 11/23/2005
Attorney Dkt #:520.45050X00
Conveyance: CORRECTION TO THE ASSIGNEE
Total properties: 1
1
Patent #:
Issue Dt:
07/15/2008
Application #:
11119934
Filing Dt:
05/03/2005
Publication #:
Pub Dt:
11/10/2005
Title:
ELECTRON MICROSCOPE, MEASURING METHOD USING THE SAME, ELECTRON MICROSCOPE SYSTEM, AND METHOD FOR CONTROLLING THE SYSTEM
Assignors
1
Exec Dt:
05/27/2005
2
Exec Dt:
05/20/2005
3
Exec Dt:
05/26/2005
4
Exec Dt:
05/24/2005
Assignee
1
24-14, NISHISHINBASHI 1-CHOME
MINATO-KU, TOKYO, JAPAN
Correspondence name and address
ANTONELLI, TERRY, STOUT & KRAUS, LLP
1300 NORTH 17TH STREET - SUITE 1800
ARLINGTON, VA 22209

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