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Reel/Frame:017433/0112   Pages: 12
Recorded: 04/06/2006
Attorney Dkt #:P001C1D3.C1
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
05/09/2006
Application #:
11242518
Filing Dt:
10/03/2005
Publication #:
Pub Dt:
02/02/2006
Title:
METHOD OF IN-WAFER TESTING OF MONOLITHIC PHOTONIC INTEGRATED CIRCUITS (PICS) FORMED IN A SEMICONDUCTOR WAFER
Assignors
1
Exec Dt:
04/05/2006
2
Exec Dt:
04/05/2006
3
Exec Dt:
04/06/2006
4
Exec Dt:
04/06/2006
5
Exec Dt:
04/05/2006
6
Exec Dt:
03/14/2006
Assignee
1
1322 BORDEAUX DRIVE
SUNNYVALE, CALIFORNIA 94089-1005
Correspondence name and address
W. DOUGLAS CAROTHERS, JR.
1322 BORDEAUX DRIVE
SUNNYVALE, CA 94089-1005

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