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Reel/Frame:017930/0628   Pages: 3
Recorded: 05/30/2006
Attorney Dkt #:3885-0108PUS1
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
10546289
Filing Dt:
05/30/2006
Publication #:
Pub Dt:
10/19/2006
Title:
Method of judging quality of semiconductor epitaxial crystal wafer and wafer manufacturing method using the same
Assignors
1
Exec Dt:
09/02/2005
2
Exec Dt:
08/31/2005
3
Exec Dt:
08/31/2005
Assignee
1
27-1, SHINKAWA 2-CHOME, CHUO-KU
TOKYO 104-8260, JAPAN
Correspondence name and address
JOHN W. BAILEY
BIRCH STEWART KOLASCH, ET AL.
8110 GATEHOUSE ROAD, SUITE 100 EAST
P.O. BOX 747
FALLS CHURCH, VA 22040-0747

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