Patent Assignment Details
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Reel/Frame: | 018444/0883 | |
| Pages: | 2 |
| | Recorded: | 10/20/2006 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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02/02/2010
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Application #:
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11583830
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Filing Dt:
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10/20/2006
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Publication #:
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Pub Dt:
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03/27/2008
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Title:
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ION BEAM MEASURING METHOD AND ION IMPLANTING APPARATUS
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Assignee
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575, KUZE TONOSHIRO-CHO |
MINAMI-KU |
KYOTO-SHI, KYOTO 601-8205, JAPAN |
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Correspondence name and address
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ERNEST F. CHAPMAN
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FINNEGAN, HENDERSON, FARABOW, GARRETT
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& DUNNER, L.L.P.
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901 NEW YORK AVENUE, NW
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WASHINGTON, D.C. 200001-4413
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