Patent Assignment Details
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For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 018913/0551 | |
| Pages: | 5 |
| | Recorded: | 02/21/2007 | | |
| Attorney Dkt #: | 0025.0065 |
| Conveyance: | CORRECTIVE ASSIGNMENT TO CORRECT THE ADDRESS OF ASSIGNEE SHOULD READ: 7839 CHURCHILL WAY PREVIOUSLY RECORDED ON REEL 018236 FRAME 0551. ASSIGNOR(S) HEREBY CONFIRMS THE ADDRESS OF ASSIGNEE CURRENTLY READS: 7839 CHURCHILLL WAY. |
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Total properties:
1
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Patent #:
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Issue Dt:
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08/02/2011
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Application #:
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11531103
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Filing Dt:
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09/12/2006
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Publication #:
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Pub Dt:
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04/10/2008
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Title:
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METHOD OF USING ELECTRICAL TEST STRUCTURE FOR SEMICONDUCTOR TRENCH DEPTH MONITOR
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Assignee
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| 7839 CHURCHILL WAY |
| MS 3999 |
| DALLAS, TEXAS 75251 |
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Correspondence name and address
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DR. PETER MCLARTY, ESQ.
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7839 CHURCHILL WAY
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MS 3999
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DALLAS, TX 75251
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