Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
| Reel/Frame: | 019535/0500 | |
| Pages: | 2 |
| | Recorded: | 06/27/2007 | | |
| Attorney Dkt #: | 1035-726 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
|
|
Total properties:
1
|
|
|
|
Patent #:
|
|
Issue Dt:
|
06/08/2010
|
Application #:
|
11819397
|
Filing Dt:
|
06/27/2007
|
|
Publication #:
|
|
Pub Dt:
|
01/03/2008
| | | | |
|
Title:
|
CORRECTION METHOD AND CORRECTION SYSTEM FOR DESIGN DATA OR MASK DATA, VALIDATION METHOD AND VALIDATION SYSTEM FOR DESIGN DATA OR MASK DATA, YIELD ESTIMATION METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT, METHOD FOR IMPROVING DESIGN RULE, MASK PRODUCTION METHOD, AND SEMICONDUCTOR INTEGRATED CIRCUIT PRODUCTION METHOD
|
|
|
Assignee
|
|
|
|
|
| 22-22 NAGAIKE-CHO ABENO-KU |
| OSAKA-SHI, OSAKA, JAPAN 545-8522 |
|
|
Correspondence name and address
|
| |
H. WARREN BURNAM, JR.
|
| |
NIXON & VANDERHYE P.C.
|
| |
901 NORTH GLEBE ROAD
|
| |
11TH FLOOR
|
| |
ARLINGTON, VA 22203
|
Search Results as of:
05/21/2024 07:49 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
