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Reel/Frame:021179/0868   Pages: 3
Recorded: 06/18/2008
Attorney Dkt #:2557-001006/US
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
12213329
Filing Dt:
06/18/2008
Publication #:
Pub Dt:
03/26/2009
Title:
Method of forming silicon nitride at low temperature, charge trap memory device including crystalline nano dots formed by using the same, and method of manufacturing the charge trap memory device
Assignors
1
Exec Dt:
06/12/2008
2
Exec Dt:
06/12/2008
3
Exec Dt:
06/12/2008
4
Exec Dt:
06/12/2008
5
Exec Dt:
06/12/2008
6
Exec Dt:
06/12/2008
Assignees
1
416 MAETAN-DONG, YEONGTONG-GU
SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
2
SAN 4-2 BONGCHEON-DONG, GWANAK-GU
SEOUL, KOREA, REPUBLIC OF
Correspondence name and address
HARNESS, DICKEY & PIERCE, P.L.C
P.O. BOX 8910
RESTON, VA 20195

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